Invention Grant
- Patent Title: Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics
- Patent Title (中): 校准和操作离子阱质量分析仪以优化质谱峰特征的方法
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Application No.: US12205624Application Date: 2008-09-05
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Publication No.: US07804065B2Publication Date: 2010-09-28
- Inventor: Philip M. Remes , Jae C. Schwartz
- Applicant: Philip M. Remes , Jae C. Schwartz
- Applicant Address: US CA San Jose
- Assignee: Thermo Finnigan LLC
- Current Assignee: Thermo Finnigan LLC
- Current Assignee Address: US CA San Jose
- Agent Charles B. Katz
- Main IPC: H01J49/42
- IPC: H01J49/42 ; H01J49/00 ; B01D59/44

Abstract:
A method for calibrating an ion trap mass spectrometer is disclosed. The method includes steps of identifying a phase (defined by the RF trapping and resonant ejection voltages) that optimizes peak characteristics, and then determining, for each of a plurality of calibrant ions, an optimal resonant ejection voltage amplitude when the ion trap is operated at the identified phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
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