Invention Grant
- Patent Title: Test techniques for a delay-locked loop receiver interface
- Patent Title (中): 延迟锁定环路接收机接口的测试技术
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Application No.: US11756674Application Date: 2007-06-01
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Publication No.: US07817761B2Publication Date: 2010-10-19
- Inventor: Meei-Ling Chiang , Dwight K. Elvey , Sanjeev Maheshwari , Emerson S. Fang
- Applicant: Meei-Ling Chiang , Dwight K. Elvey , Sanjeev Maheshwari , Emerson S. Fang
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Zagorin O'Brien Graham LLP
- Main IPC: H04L7/00
- IPC: H04L7/00 ; H03L7/06

Abstract:
An integrated circuit includes a variable delay circuit configured to generate at least one delayed clock signal based on a first clock signal and a first control signal. The integrated circuit includes a control circuit configured to generate a count value based on a second input signal and a second control signal. The first clock signal is a first version of the at least one delayed clock signal. At least one of the second input signal and the second control signal is a second version of the at least one delayed clock signal and the count value is indicative of a frequency characteristic of the at least one delayed clock signal. The integrated circuit is configured to monotonically vary the first control signal over a range of values and the count value is determined for individual values of the control signal.
Public/Granted literature
- US20080297216A1 TEST TECHNIQUES FOR A DELAY-LOCKED LOOP RECEIVER INTERFACE Public/Granted day:2008-12-04
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