Invention Grant
- Patent Title: Apparatus and method for thermal detection
- Patent Title (中): 用于热检测的装置和方法
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Application No.: US11138532Application Date: 2005-05-26
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Publication No.: US07828478B2Publication Date: 2010-11-09
- Inventor: Siddharth S. Rege , Joseph E. Harter, Jr. , Ronald M. Taylor
- Applicant: Siddharth S. Rege , Joseph E. Harter, Jr. , Ronald M. Taylor
- Applicant Address: US MI Troy
- Assignee: Delphi Technologies, Inc.
- Current Assignee: Delphi Technologies, Inc.
- Current Assignee Address: US MI Troy
- Agent Thomas N. Twomey
- Main IPC: G01K1/14
- IPC: G01K1/14 ; G01K5/02 ; G01J1/28

Abstract:
A thermal detecting device for sensing temperature at multiple locations proximate to the detecting device is provided. The detecting device has a pair of infrared detectors each configured to measure temperature of two locations by receiving infrared energy of the two locations. A housing encloses the pair of infrared detectors. The housing is configured with an aperture to allow the infrared energy of the two locations to be received by the pair of infrared detectors. A reflective mirror or two mirrors focus the infrared energy of the two locations towards the pair of infrared detectors. The detecting device may be configured to determine if there is a temperature differential at a location as the housing moves with respect to the location.
Public/Granted literature
- US20060067378A1 Apparatus and method for thermal detection Public/Granted day:2006-03-30
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