Invention Grant
- Patent Title: Method and an ion source for obtaining ions of an analyte
- Patent Title (中): 用于获得分析物离子的方法和离子源
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Application No.: US11963843Application Date: 2007-12-23
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Publication No.: US07855358B2Publication Date: 2010-12-21
- Inventor: Arthur Schleifer , Steven Michael Fischer
- Applicant: Arthur Schleifer , Steven Michael Fischer
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
A method of obtaining ions of an analyte is disclosed. The method includes aerosolizing a sample using a thermal liquid jetting device or a piezoelectric liquid jetting device to obtain an aerosol without ionizing the sample. The sample includes the analyte in a solvent. The method further includes drying the aerosol to obtain gas phase solvent and gas phase analyte, and ionizing the gas phase analyte to obtain ions thereof. An ion source using the method for obtaining ions of an analyte is also disclosed.
Public/Granted literature
- US20090159794A1 METHOD AND AN ION SOURCE FOR OBTAINING IONS OF AN ANALYTE Public/Granted day:2009-06-25
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