Invention Grant
- Patent Title: Electric charged particle beam microscope and microscopy
- Patent Title (中): 带电粒子束显微镜和显微镜
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Application No.: US12259771Application Date: 2008-10-28
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Publication No.: US07863564B2Publication Date: 2011-01-04
- Inventor: Ruriko Tsuneta , Hideki Kikuchi , Takafumi Yotsuji , Toshie Yaguchi
- Applicant: Ruriko Tsuneta , Hideki Kikuchi , Takafumi Yotsuji , Toshie Yaguchi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- Priority: JP2007-279781 20071029
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
An electric charged particle beam microscope is provided in which a specimen movement due to a specimen rotation is classified into a repeatable movement and a non-repeatable movement, a model of movement is determined for the repeatable movement, a range of movement is determined for the non-repeatable movement, the repeatable movement is corrected on the basis of the movement model through open-loop and the non-repeatable movement is corrected under a condition set on the basis of the range of movement.
Public/Granted literature
- US20090127474A1 ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY Public/Granted day:2009-05-21
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