Invention Grant
- Patent Title: Multiple surface inspection system and method
- Patent Title (中): 多表面检查系统和方法
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Application No.: US12118209Application Date: 2008-05-09
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Publication No.: US07869021B2Publication Date: 2011-01-11
- Inventor: Ajharali Amanullah , Han Cheng Ge , Huek Choy Tan , Hing Tim Lai
- Applicant: Ajharali Amanullah , Han Cheng Ge , Huek Choy Tan , Hing Tim Lai
- Applicant Address: SG Singapore
- Assignee: ASTI Holdings Limited
- Current Assignee: ASTI Holdings Limited
- Current Assignee Address: SG Singapore
- Agency: Jackson Walker L.L.P.
- Agent Christopher J. Rourk
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.
Public/Granted literature
- US20090073426A1 Multiple Surface Inspection System and Method Public/Granted day:2009-03-19
Information query
