Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US12296360Application Date: 2006-04-07
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Publication No.: US07872223B2Publication Date: 2011-01-18
- Inventor: Shinichi Yamaguchi
- Applicant: Shinichi Yamaguchi
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2006/307469 WO 20060407
- International Announcement: WO2007/116509 WO 20071018
- Main IPC: H01J49/04
- IPC: H01J49/04

Abstract:
A laser light is linearly delivered onto the sample 4. The ions generated from the irradiated area are collected, mass-separated in the mass separator 27, and detected by the detector 28. A mass analysis is repeated while moving the sample stage 3 by a predetermined step width in the x-axis direction so that the one-dimensional mass spectrum information of the sample 4 at a certain rotational position is obtained. Additionally, while the sample 4 is rotated by a predetermined angle, the same measurement is repeated for the entire perimeter, so that the one-dimensional mass spectrum information at each rotational position is obtained. Based on the data obtained in this manner, a reconstruction computational processing is performed by the CT method to reconstruct the two-dimensional distribution image for a substance having a certain mass for example and the image is displayed on the display 35.
Public/Granted literature
- US20090159789A1 MASS SPECTROMETER Public/Granted day:2009-06-25
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