Invention Grant
- Patent Title: Optical integrated nanospectrometer
- Patent Title (中): 光学综合纳米光度计
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Application No.: US12012045Application Date: 2008-02-01
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Publication No.: US07889336B2Publication Date: 2011-02-15
- Inventor: Vladimir Yankov
- Applicant: Vladimir Yankov
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/44 ; G02B6/12

Abstract:
A planar nanospectrometer formed as a single chip that uses diffraction structures, which are combinations of numerous nano-features placed in a predetermined configuration and providing multiple functionalities such as guiding light, resonantly reflecting light at multiple wavelengths, directing light to detectors, and focusing light on the detectors. The diffraction structure can be described as a digital planar hologram that comprises an optimized combination of overlaid virtual sub-gratings, each of which is resonant to a single wavelength of light. Each device includes at least one sensor, at least one light source, and at least one digital planar hologram in an optical waveguide. The device of the present invention allows detection of small amounts of analytes in gases and liquids or on solid surfaces and can be particularly advantageous for field analysis of environmental safety in multiple locations because of its miniature size and low cost.
Public/Granted literature
- US20090195778A1 Optical integrated nanospectrometer and method of manufacturing thereof Public/Granted day:2009-08-06
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