Invention Grant
US07901136B2 Methods and system for calibrating and correcting a detection system 有权
校准和校正检测系统的方法和系统

Methods and system for calibrating and correcting a detection system
Abstract:
A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.
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