Invention Grant
- Patent Title: Method and microscope for high spatial resolution examination of samples
- Patent Title (中): 样品高空间分辨率检测方法与显微镜
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Application No.: US12543904Application Date: 2009-08-19
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Publication No.: US07903247B2Publication Date: 2011-03-08
- Inventor: Marcus Dyba , Hilmar Gugel
- Applicant: Marcus Dyba , Hilmar Gugel
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Foley & Lardner LLP
- Priority: DE102006009833 20060301
- Main IPC: G01J3/30
- IPC: G01J3/30

Abstract:
A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
Public/Granted literature
- US20090303474A1 METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SAMPLES Public/Granted day:2009-12-10
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