Invention Grant
- Patent Title: Mass spectroscopy system and mass spectroscopy method
- Patent Title (中): 质谱系统和质谱法
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Application No.: US12190988Application Date: 2008-08-13
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Publication No.: US07906759B2Publication Date: 2011-03-15
- Inventor: Naomi Manri , Takashi Baba , Hiroyuki Satake
- Applicant: Naomi Manri , Takashi Baba , Hiroyuki Satake
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- Priority: JP2007-237389 20070913
- Main IPC: H01J49/06
- IPC: H01J49/06 ; H01J49/40 ; G01N27/62

Abstract:
An inexpensive mass spectrometer system is provided. This mass spectrometer is capable obtaining structural information of a substance at an improved efficiency, and the time required for the analysis and identification of the substance has been reduced. Identification precision has also been improved. More specifically, this invention provides a tandem mass spectrometer system in which the sample is ionized at the desired polarity, fragment ions obtained by dissociating the ion is analyzed in first or second mass spectrometer section, polarity of the second mass spectrometer is determined based on the result of the analysis, and the mass spectroscopy is carried out. A method for the mass spectroscopy is also provided.
Public/Granted literature
- US20090072132A1 MASS SPECTROSCOPY SYSTEM AND MASS SPECTROSCOPY METHOD Public/Granted day:2009-03-19
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