Invention Grant
- Patent Title: MIM capacitor structure and fabricating method thereof
- Patent Title (中): MIM电容器结构及其制造方法
-
Application No.: US11748481Application Date: 2007-05-14
-
Publication No.: US07919802B2Publication Date: 2011-04-05
- Inventor: Chun-Yi Lin , Chien-Chou Hung
- Applicant: Chun-Yi Lin , Chien-Chou Hung
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L27/108
- IPC: H01L27/108

Abstract:
A method for fabricating an MIM capacitor is disclosed. First, a substrate is provided having a first dielectric layer thereon. Next at least one first damascene conductor is formed within the first dielectric layer, and a second dielectric layer with a capacitor opening is formed on the first dielectric layer, in which the capacitor opening is situated directly above the first damascene conductor. Next, an MIM capacitor having a top plate and a bottom plate is created within the capacitor opening, in which the bottom plate of the MIM capacitor is electrically connected to the first damascene conductor. Next, a third dielectric layer is deposited on the second dielectric layer and the MIM capacitor, and at least one second damascene conductor is formed within part of the third dielectric layer, in which the second damascene conductor is electrically connected to the top plate of the MIM capacitor.
Public/Granted literature
- US20070212845A1 MIM capacitor structure and fabricating method thereof Public/Granted day:2007-09-13
Information query
IPC分类: