Invention Grant
US07965390B1 Automatic sample alignment system and method of use 有权
自动样品校准系统及使用方法

Automatic sample alignment system and method of use
Abstract:
A system which automatically reduces change in effective angle and plane of incidence of a reflected focused beam of electromagnetic radiation entering a detector, via use of a detector with dimensions less than is the spatial spread of a reflected focused beam at a location distal to the location on said sample from which it is caused to reflect, preferably after passing through a collimating lens. The basis of operation is that the portion of a reflected focused beam intercepted by the detector changes with change in sample position and/or orientation.
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