Invention Grant
- Patent Title: Automatic sample alignment system and method of use
- Patent Title (中): 自动样品校准系统及使用方法
-
Application No.: US12378019Application Date: 2009-02-10
-
Publication No.: US07965390B1Publication Date: 2011-06-21
- Inventor: Martin M. Liphardt
- Applicant: Martin M. Liphardt
- Applicant Address: US NE Lincoln
- Assignee: J.A. Woollam Co., Inc.
- Current Assignee: J.A. Woollam Co., Inc.
- Current Assignee Address: US NE Lincoln
- Agent James D. Welch
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01J4/00 ; G01N21/55

Abstract:
A system which automatically reduces change in effective angle and plane of incidence of a reflected focused beam of electromagnetic radiation entering a detector, via use of a detector with dimensions less than is the spatial spread of a reflected focused beam at a location distal to the location on said sample from which it is caused to reflect, preferably after passing through a collimating lens. The basis of operation is that the portion of a reflected focused beam intercepted by the detector changes with change in sample position and/or orientation.
Information query