Invention Grant
- Patent Title: Spectroscopic ellipsometer
- Patent Title (中): 光谱椭偏仪
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Application No.: US12389707Application Date: 2009-02-20
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Publication No.: US07973930B2Publication Date: 2011-07-05
- Inventor: Satoru Tanaka
- Applicant: Satoru Tanaka
- Applicant Address: JP Kyoto
- Assignee: HORIBA, Ltd.
- Current Assignee: HORIBA, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Alleman Hall McCoy Russell & Tuttle LLP
- Priority: JP2008-055584 20080305
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
A spectroscopic ellipsometer can compare data different in a measurement condition and facilitate setting an initial value of fitting data even for an inexperienced operator such as a beginner. The spectroscopic ellipsometer includes a reference data storage part storing therein reference data to be compared with measurement data, a conversion operation part converting the measurement data or the reference data into comparable data, so that the measurement data can be compared with the reference data, and a comparison and determination part comparing the measurement data with the reference data made comparable by the conversion operation part with each other and determining a coincidence between the measurement data and the reference data.
Public/Granted literature
- US20090225317A1 SPECTROSCOPIC ELLIPSOMETER Public/Granted day:2009-09-10
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