Invention Grant
- Patent Title: Systems and methods for analyzing substances using a mass spectrometer
- Patent Title (中): 使用质谱仪分析物质的系统和方法
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Application No.: US12326241Application Date: 2008-12-02
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Publication No.: US07985948B2Publication Date: 2011-07-26
- Inventor: Ron F. Bonner , Lyle L. Burton , Yves Le Blanc
- Applicant: Ron F. Bonner , Lyle L. Burton , Yves Le Blanc
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Kasha Law LLC
- Agent John R. Kasha
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
Systems and methods for analyzing compounds in a sample. In one embodiment, the present technology is directed towards a method of analyzing a sample, comprising: emitting ions from the sample; selecting the emitted ions for a designated ion; fragmenting the designated ions; scanning for a plurality of designated ion fragments; determining a designated fragment chromatographic trace for each designated ion fragment; and generating a combined chromatographic trace corresponding to a non-linear combination of a plurality of designated fragment chromatographic traces.
Public/Granted literature
- US20090140139A1 SYSTEMS AND METHODS FOR ANALYZING SUBSTANCES USING A MASS SPECTROMETER Public/Granted day:2009-06-04
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