Invention Grant
- Patent Title: Methods for concealing surface defects
- Patent Title (中): 隐藏表面缺陷的方法
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Application No.: US12317523Application Date: 2008-12-24
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Publication No.: US07985957B2Publication Date: 2011-07-26
- Inventor: Sergei Voronov
- Applicant: Sergei Voronov
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Winkle, PLLC
- Main IPC: G21K5/10
- IPC: G21K5/10 ; C21D1/00 ; H01J37/08
Abstract:
Methods for removing random or uncontrolled surface defects from a work piece surface are provided, by applying a plurality of induced controlled defects over the random defects to alter the surface texture.
Public/Granted literature
- US20100155625A1 Methods for concealing surface defects Public/Granted day:2010-06-24
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