Invention Grant
- Patent Title: Gas analyzing method and gas analyzing apparatus
- Patent Title (中): 气体分析方法和气体分析仪
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Application No.: US12347377Application Date: 2008-12-31
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Publication No.: US07989761B2Publication Date: 2011-08-02
- Inventor: Tadashi Arii , Kyoji Matsumoto , Satoshi Otake
- Applicant: Tadashi Arii , Kyoji Matsumoto , Satoshi Otake
- Applicant Address: JP Akishima-Shi, Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Akishima-Shi, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2008-001651 20080108
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/14 ; B01D59/44

Abstract:
Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained through soft ionization process from a second gas having same concentration of components as that of the first gas are subjected to mass analysis to obtain ion intensities which stored in a second file, and molecular weights are determined based on parent ions from soft ionization measurement data. A mass spectrum corresponding to the determined molecular weight is read out based on an NIST database, and the ion intensity data stored in the first file and the read out NIST data are compared with each other, and component molecules of the first gas are determined based on the comparison results. Qualitative analysis of mixed gas can be conducted in real time with high accuracy by making effective use of the measurement data of both mass analysis based on EI process and mass analysis based on soft ionization process.
Public/Granted literature
- US20090173879A1 GAS ANALYZING METHOD AND GAS ANALYZING APPARATUS Public/Granted day:2009-07-09
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