Invention Grant
US08010310B2 Method and apparatus for identifying outliers following burn-in testing
有权
用于识别老化测试后异常值的方法和装置
- Patent Title: Method and apparatus for identifying outliers following burn-in testing
- Patent Title (中): 用于识别老化测试后异常值的方法和装置
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Application No.: US11829203Application Date: 2007-07-27
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Publication No.: US08010310B2Publication Date: 2011-08-30
- Inventor: Rajesh Vijayaraghavan , Benjamin Ertle , James E. Routh , Paul A. Ferno
- Applicant: Rajesh Vijayaraghavan , Benjamin Ertle , James E. Routh , Paul A. Ferno
- Applicant Address: US TX Austin
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US TX Austin
- Agency: Williams, Morgan & Amerson, P.C.
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R31/26
Abstract:
A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.
Public/Granted literature
- US20090027077A1 METHOD AND APPARATUS FOR IDENTIFYING OUTLIERS FOLLOWING BURN-IN TESTING Public/Granted day:2009-01-29
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