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US08048752B2 Spacer shape engineering for void-free gap-filling process 有权
无间隙填充过程的间隔形状工程

Spacer shape engineering for void-free gap-filling process
Abstract:
A method of forming a semiconductor device includes providing a semiconductor substrate; forming a gate stack on the semiconductor substrate; forming a gate spacer adjacent to a sidewall of the gate stack; thinning the gate spacer; and forming a secondary gate spacer on a sidewall of the gate spacer after the step of thinning the gate spacer.
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