Invention Grant
- Patent Title: Spacer shape engineering for void-free gap-filling process
- Patent Title (中): 无间隙填充过程的间隔形状工程
-
Application No.: US12179395Application Date: 2008-07-24
-
Publication No.: US08048752B2Publication Date: 2011-11-01
- Inventor: Ming-Yuan Wu , Yi-Shien Mor , Chih-Tang Peng , Chiung-Han Yeh , Kong-Beng Thei , Harry Chuang , Mong-Song Liang
- Applicant: Ming-Yuan Wu , Yi-Shien Mor , Chih-Tang Peng , Chiung-Han Yeh , Kong-Beng Thei , Harry Chuang , Mong-Song Liang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of forming a semiconductor device includes providing a semiconductor substrate; forming a gate stack on the semiconductor substrate; forming a gate spacer adjacent to a sidewall of the gate stack; thinning the gate spacer; and forming a secondary gate spacer on a sidewall of the gate spacer after the step of thinning the gate spacer.
Public/Granted literature
- US20100022061A1 Spacer Shape Engineering for Void-Free Gap-Filling Process Public/Granted day:2010-01-28
Information query
IPC分类: