Semiconductor fabrication method suitable for MEMS

Invention Grant

US08084361B2 Semiconductor fabrication method suitable for MEMS 有权

Title translation: 适用于MEMS的半导体制造方法

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Patent Title: Semiconductor fabrication method suitable for MEMS
Patent Title (中): 适用于MEMS的半导体制造方法
Application No.: US11755437

Application Date: 2007-05-30
Publication No.: US08084361B2

Publication Date: 2011-12-27
Inventor: Tsung-Cheng Huang , Hua-Shu Wu , Fa-Yuan Chang , I-Ching Lin , Hsi-Lung Lee , Yuan-Hao Chien
Applicant: Tsung-Cheng Huang , Hua-Shu Wu , Fa-Yuan Chang , I-Ching Lin , Hsi-Lung Lee , Yuan-Hao Chien
Applicant Address: TW Hsin-Chu
Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
Current Assignee Address: TW Hsin-Chu
Agency: Duane Morris LLP
Agent Steven E. Koffs
Main IPC: H01L21/3213
IPC: H01L21/3213

Semiconductor fabrication method suitable for MEMS

Abstract:

A method includes depositing a layer of a sacrificial material in a first region above a substrate. The first region of the substrate is separate from a second region of the substrate, where a corrosion resistant film is to be provided above the second region. The corrosion resistant film is deposited, so that a first portion of the corrosion resistant film is above the sacrificial material in the first region, and a second portion of the corrosion resistant film is above the second region. The first portion of the corrosion resistant film is removed by chemical mechanical polishing. The sacrificial material is removed from the first region using an etching process that selectively etches the sacrificial material, but not the corrosion resistant film.

Abstract(Chinese):

一种方法包括在基底上方的第一区域中沉积牺牲材料层。衬底的第一区域与衬底的第二区域分离，其中在第二区域上方设置耐腐蚀膜。沉积耐腐蚀膜，使得耐腐蚀膜的第一部分在第一区域中的牺牲材料之上，并且耐腐蚀膜的第二部分高于第二区域。通过化学机械抛光除去耐腐蚀膜的第一部分。使用选择性蚀刻牺牲材料而不是耐腐蚀膜的蚀刻工艺从第一区域去除牺牲材料。

Public/Granted literature

US20080299769A1 SEMICONDUCTOR FABRICATION METHOD SUITABLE FOR MEMS Public/Granted day:2008-12-04

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/02	.半导体器件或其部件的制造或处理
H01L21/04	..至少具有一个跃变势垒或表面势垒的器件，例如PN结、耗尽层、载体集结层
H01L21/18	...器件有由周期表Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体，如掺杂材料
H01L21/30	....用H01L21/20至H01L21/26各组不包含的方法或设备处理半导体材料的（在半导体材料上制作电极的入H01L21/28）
H01L21/31	.....在半导体材料上形成绝缘层的，例如用于掩膜的或应用光刻技术的（密封层入H01L21/56）；以及这些层的后处理；这些层的材料的选择
H01L21/3205	......非绝缘层的沉积，例如绝缘层上的导电层或电阻层；这些层的后处理（电极的制造入H01L21/28）
H01L21/321	.......后处理
H01L21/3213	........对该层进行物理的或化学的腐蚀，例如由预沉积的外延层产生一个形成图形的层