Invention Grant
US08088615B2 Optical component for observing a nanometric sample, system comprising same, analysis method using same, and uses thereof 有权
用于观察纳米样品的光学部件,包括其的系统,使用其的分析方法及其用途

  • Patent Title: Optical component for observing a nanometric sample, system comprising same, analysis method using same, and uses thereof
  • Patent Title (中): 用于观察纳米样品的光学部件,包括其的系统,使用其的分析方法及其用途
  • Application No.: US11631846
    Application Date: 2005-07-06
  • Publication No.: US08088615B2
    Publication Date: 2012-01-03
  • Inventor: Dominique Ausserre
  • Applicant: Dominique Ausserre
  • Agency: Blank Rome LLP
  • Priority: FR0407517 20040707
  • International Application: PCT/FR2005/001746 WO 20050706
  • International Announcement: WO2006/013287 WO 20060209
  • Main IPC: C12Q1/68
  • IPC: C12Q1/68 C12M1/34 G01J4/00
Optical component for observing a nanometric sample, system comprising same, analysis method using same, and uses thereof
Abstract:
The invention concerns an optical component for observing a sample, which includes a substrate and at least one complex index layer of predetermined thickness, designed to show a high intensity or color contrast for optical path variations, reliefs, nanometric thicknesses and diameters when it is observed by incoherent light reflection convergent around the normal incidence under polarization extinction conditions. The upper index layer has specific surface properties providing it with selective affinity relative to at least one characteristic of the sample. An analysis system includes such a component, an analysis method using the component and uses of the method.
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