Invention Grant
- Patent Title: Fluorescence detecting method and fluorescence detecting apparatus
- Patent Title (中): 荧光检测方法和荧光检测装置
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Application No.: US12400322Application Date: 2009-03-09
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Publication No.: US08097862B2Publication Date: 2012-01-17
- Inventor: Toshihito Kimura
- Applicant: Toshihito Kimura
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-060435 20080311
- Main IPC: G01J1/58
- IPC: G01J1/58
Abstract:
Fluorescence detection utilizes surface plasmon. The intensity of scattered light, which is substantially proportionate to the intensity of an electric field enhancing field generated on a metal film, is employed, to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the electric field enhancing field.
Public/Granted literature
- US20090230308A1 FLUORESCENCE DETECTING METHOD AND FLUORESCENCE DETECTING APPARATUS Public/Granted day:2009-09-17
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