Invention Grant
- Patent Title: Probe array and method of manufacturing the same
- Patent Title (中): 探头阵列及其制造方法
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Application No.: US12494736Application Date: 2009-06-30
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Publication No.: US08110817B2Publication Date: 2012-02-07
- Inventor: Teruhisa Shibahara
- Applicant: Teruhisa Shibahara
- Applicant Address: JP Nagaokakyo-Shi, Kyoto-fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Nagaokakyo-Shi, Kyoto-fu
- Agency: Dickstein Shapiro LLP
- Priority: JP2008-176717 20080707
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
A probe array includes a probe-carrying substrate and a base member. The probe-carrying substrate has first and second principal surfaces extending parallel to each other, and a plurality of probe carriers carrying probe molecules. The base member has a reference surface extending parallel to a fluorescence-receiving surface, and a seating surface supporting the probe-carrying substrate and extending in a direction other than a direction parallel to the reference surface. The probe carriers each have a plurality of surfaces forming different angles with respect to the fluorescence-receiving surface, the plurality of surfaces including a bottom surface and uprising surfaces extending from the bottom surface. Accordingly, the plurality of surfaces have different sensitivities, realizing a wide dynamic range.
Public/Granted literature
- US20100001207A1 Probe Array and Method of Manufacturing the Same Public/Granted day:2010-01-07
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