Invention Grant
- Patent Title: Plate inspection system and plate inspection method
- Patent Title (中): 板检系统和板检查方法
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Application No.: US12067380Application Date: 2007-05-14
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Publication No.: US08111397B2Publication Date: 2012-02-07
- Inventor: Norihisa Moriya
- Applicant: Norihisa Moriya
- Applicant Address: JP Shinjuku-Ku
- Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee Address: JP Shinjuku-Ku
- Agency: Burr & Brown
- Priority: JP2006-135460 20060515; JP2007-054669 20070305
- International Application: PCT/JP2007/059884 WO 20070514
- International Announcement: WO2007/132818 WO 20071122
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
A plate inspection system and a plate inspection method with which irregularities in phase difference caused in a retardation layer can be efficiently detected. The inspection system is for inspecting a plate to be inspected having a retardation layer. The plate inspection system comprises a polarized-light source for irradiating a polarized light and an observation-side polarizer placed on the observation side. In the inspection system, a plate to be inspected is placed between the polarized-light source and the observation-side polarizer so that the plate to be inspected is irradiated with polarized light from the polarized-light source. The position of at least the observation-side polarizer or the plate to be inspected is changeable relative to the polarized-light source.
Public/Granted literature
- US20090153849A1 PLATE INSPECTION SYSTEM AND PLATE INSPECTION METHOD Public/Granted day:2009-06-18
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