Invention Grant
- Patent Title: Device for providing a high energy X-ray beam
- Patent Title (中): 用于提供高能量X射线束的装置
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Application No.: US12667464Application Date: 2008-07-02
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Publication No.: US08121258B2Publication Date: 2012-02-21
- Inventor: Peter Hoghoj , Pascal Boulee , Paraskevi Ntova , Sergio Rodrigues
- Applicant: Peter Hoghoj , Pascal Boulee , Paraskevi Ntova , Sergio Rodrigues
- Applicant Address: FR Sassenage
- Assignee: Xenocs
- Current Assignee: Xenocs
- Current Assignee Address: FR Sassenage
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: FR0756227 20070702
- International Application: PCT/FR2008/000946 WO 20080702
- International Announcement: WO2009/024669 WO 20090226
- Main IPC: H01J35/10
- IPC: H01J35/10
Abstract:
The invention relates to X-ray analytical instruments (RX), more precisely a device for providing a high energy X-ray beam, typically above 4 keV, for X-ray analysis applications. The device comprises an X-ray tube with a turning anode and an X-ray lens for shaping the beam.
Public/Granted literature
- US20110255668A1 DEVICE FOR PROVIDING A HIGH ENERGY X-RAY BEAM Public/Granted day:2011-10-20
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