Invention Grant
- Patent Title: Parity error detecting circuit and method
- Patent Title (中): 奇偶校验误差检测电路及方法
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Application No.: US11829583Application Date: 2007-07-27
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Publication No.: US08122334B2Publication Date: 2012-02-21
- Inventor: Young-Hun Lee , Jae-Youl Lee , Jong-Seon Kim , Kyung-Suc Nah
- Applicant: Young-Hun Lee , Jae-Youl Lee , Jong-Seon Kim , Kyung-Suc Nah
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2007-0002312 20070109
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/28

Abstract:
A parity error detecting circuit includes a first operation unit, a second operation unit, and a shift register. The first operation unit receives a serial data signal and a first signal, performs a logic operation on the two received signals, and outputs the result of the logic operation as the first signal in response to a first clock signal. The shift register shifts the first signal in response to the first clock signal and outputs a second signal. The second operation unit receives the first signal and the second signal, performs a logic operation on the two received signals, and outputs the result of the logic operation in response to a second clock signal.
Public/Granted literature
- US20080168338A1 PARITY ERROR DETECTING CIRCUIT AND METHOD Public/Granted day:2008-07-10
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