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US08134623B2 Analog-to-digital conversion in image sensors using a differential comparison 有权
使用差分比较的图像传感器中的模数转换

Analog-to-digital conversion in image sensors using a differential comparison
Abstract:
An image sensor has a per-column ADC arrangement including first and second capacitors for correlated double sampling, and a comparator circuit. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential amplifier having one input connected to the junction of the two capacitors and another input connected to a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential amplifier as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast.
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