Abstract:
An image sensor includes an array of pixels. Each pixel has at least one photo-sensitive element. Readout circuitry receives an analog signal from each pixel at a first time and at a second time, between which the analog signal changes. The image sensor further includes associated support circuitry which is a source of time variant noise. The signal level at both first and second times includes pixel noise. Sample and hold circuitry is provided to maintain substantially level at least a proportion of this support circuitry noise time invariant at the sensor output between the first time and the second time.
Abstract:
A column current source for an image sensor includes an array of pixels arranged in rows and columns, a reference current source, a transistor connected as a source follower to the reference current source and forming one half of a current mirror, and a plurality of current sources each connected to a column of pixels and with each current source forming the other half of the current mirror, thereby mirroring the reference current source. The current sources are connected to a first common node. A resistor is connected between the first common node and a second common node. One or more resistors are connected in series between the second common node and the transistor drain, and two or more switches are selectively operable to short circuit the resistors allowing the current sources to provide more than two current levels, thereby optimizing the image sensor current consumption for mobile devices.
Abstract:
A column current source for an image sensor includes an array of pixels arranged in rows and columns, a reference current source, a transistor connected as a source follower to the reference current source and forming one half of a current mirror, and a plurality of current sources each connected to a column of pixels and with each current source forming the other half of the current mirror, thereby mirroring the reference current source. The current sources are connected to a first common node. A resistor is connected between the first common node and a second common node. One or more resistors are connected in series between the second common node and the transistor drain, and two or more switches are selectively operable to short circuit the resistors allowing the current sources to provide more than two current levels, thereby optimizing the image sensor current consumption for mobile devices.
Abstract:
An image sensor includes a pixel array, and a correlated double sample circuit coupled to one of the pixels in the pixel array. The correlated double sample circuit includes first and second inputs, and first and second sample capacitors respectively coupled to the first and second inputs. The first input is for receiving an analog signal from a pixel, and the second input is for receiving a time varying reference signal. The analog signal varies during a pixel readout period, and has a first level during a first reset period and a second-level during a second read period. A comparator circuit compares the time varying reference signal and the analog signal. The analog signal and the time varying reference signal are constantly read onto one of the first and second sample capacitors during both the first reset period and the second read period.
Abstract:
The image sensor makes use of a distributed amplifier having its non-inverting input provided by a pixel amplifier transistor, and its inverting input and output provided in the pixel's column circuitry. The distributed amplifier is directly integrated with the image sensor's ADC circuit, and sampling and autozero are performed in a single step, thus reducing the number of noise contributions made by the components of the image sensor's readout chain.
Abstract:
An image sensor includes an array of pixels. Each pixel has at least one photo-sensitive element. Readout circuitry receives an analog signal from each pixel at a first time and at a second time, between which the analog signal changes. The image sensor further includes associated support circuitry which is a source of time variant noise. The signal level at both first and second times includes pixel noise. Sample and hold circuitry is provided to maintain substantially level at least a proportion of this support circuitry noise time invariant at the sensor output between the first time and the second time.
Abstract:
An image sensor has a per-column ADC arrangement including first and second capacitors for correlated double sampling, and a comparator circuit. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential amplifier having one input connected to the junction of the two capacitors and another input connected to a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential amplifier as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast.
Abstract:
An image sensor includes a pixel array, and a correlated double sample circuit coupled to one of the pixels in the pixel array. The correlated double sample circuit includes first and second inputs, and first and second sample capacitors respectively coupled to the first and second inputs. The first input is for receiving an analog signal from a pixel, and the second input is for receiving a time varying reference signal. The analog signal varies during a pixel readout period, and has a first level during a first reset period and a second-level during a second read period. A comparator circuit compares the time varying reference signal and the analog signal. The analog signal and the time varying reference signal are constantly read onto one of the first and second sample capacitors during both the first reset period and the second read period.
Abstract:
An image sensor includes an array of pixels arranged in rows and columns. A reference current source provides the reference current to a transistor forming one half of a current mirror. Each column has a current source, which forms the other half of a current mirror. A switch is provided to selectively connect a resistance between ground and the transistor. When the resistance is connected, the transistor is starved of gate-source voltage, which reduces the current supplied by each current source.
Abstract:
The readout circuit, for an image sensing pixel array, is arranged to perform correlated double sampling and includes readout circuitry which is capable of learning its own internal offset and the offset of both its inputs. In the process of correlated double sampling, one of two sampling capacitors can be made smaller, as the thermal noise it creates is learned. The reduction of size of the appropriate sampling capacitor enables the size of a column multiplexer to be reduced without affecting its noise contribution.