Invention Grant
US08147914B2 Orientation-controlled self-assembled nanolithography using a block copolymer
有权
使用嵌段共聚物的取向控制的自组装纳米光刻技术
- Patent Title: Orientation-controlled self-assembled nanolithography using a block copolymer
- Patent Title (中): 使用嵌段共聚物的取向控制的自组装纳米光刻技术
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Application No.: US12137016Application Date: 2008-06-11
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Publication No.: US08147914B2Publication Date: 2012-04-03
- Inventor: Yeon Sik Jung , Caroline A. Ross
- Applicant: Yeon Sik Jung , Caroline A. Ross
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Gesmer Updegrove LLP
- Main IPC: B05D3/02
- IPC: B05D3/02

Abstract:
Disclosed is a structure made of a trench patterned substrate having a pre-determined trench period and a pre-determined mesa to trench width ratio, and a block copolymer on top of the trench patterned substrate. The block copolymer has at least an organic block and a silicon-containing block, wherein the block copolymer can have either perpendicular or parallel cylinders. The structure is annealed under a pre-determined vapor pressure for a predetermined annealing time period, wherein the pre-determined trench period, the pre-determined mesa to trench width ratio, the predetermined vapor pressure and the predetermined annealing time period are chosen such that cylinders formed in the block copolymer are either perpendicular or parallel with respect to the trench-patterned substrate. A method is also described to form the above-mentioned structure.
Public/Granted literature
- US20080311402A1 ORIENTATION-CONTROLLED SELF-ASSEMBLED NANOLITHOGRAPHY USING A BLOCK COPOLYMER Public/Granted day:2008-12-18
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