Invention Grant
US08184276B2 Continuous index of refraction compensation method for measurements in a medium 有权
介质中测量的连续折射补偿方法

  • Patent Title: Continuous index of refraction compensation method for measurements in a medium
  • Patent Title (中): 介质中测量的连续折射补偿方法
  • Application No.: US12632102
    Application Date: 2009-12-07
  • Publication No.: US08184276B2
    Publication Date: 2012-05-22
  • Inventor: Carl Embry
  • Applicant: Carl Embry
  • Agency: Greenlee Sullivan P.C.
  • Main IPC: G01N21/41
  • IPC: G01N21/41
Continuous index of refraction compensation method for measurements in a medium
Abstract:
Described herein are devices and methods for making extremely accurate measurements in a medium by continuously measuring the index of refraction of the medium such as water or biological tissue. Also described herein is a device for constantly measuring the index of refraction, and using the index of refraction data to constantly calibrate the optical measurement device. In addition, a primary measurement device (a ladar) that is optimized for data collection in a volume backscattering medium such as water or biological tissue is described, along with data results from the lab.
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