Invention Grant
- Patent Title: Device and method for analyzing a sample
- Patent Title (中): 用于分析样品的装置和方法
-
Application No.: US12524620Application Date: 2008-02-01
-
Publication No.: US08232521B2Publication Date: 2012-07-31
- Inventor: Joseph A. Jarrell , Michael J. Tomany
- Applicant: Joseph A. Jarrell , Michael J. Tomany
- Applicant Address: US MA Milford
- Assignee: Waters Technologies Corporation
- Current Assignee: Waters Technologies Corporation
- Current Assignee Address: US MA Milford
- Agency: Guerin + Rodriguez, LLP
- International Application: PCT/US2008/052768 WO 20080201
- International Announcement: WO2008/097831 WO 20080814
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
Embodiments of the invention relate to a device for analyzing a sample surface Comprising an outlet and a frame. The outlet is for forming a jet of gas, the jet forming a sampling region for receiving one or more sample surfaces, and the frame holding the outlet and being adapted to receive a detector means. The detector means has an inlet. In use, the jet produces desorbed sample from sample surfaces received in the sample area. At least a portion of the desorbed sample is ionized to produce one or more sample ions. The frame holds the outlet with respect to the sample ions and produce a signal indicative of the composition of the sample ions.
Public/Granted literature
- US20100148057A1 Device And Method For Analyzing A Sample Public/Granted day:2010-06-17
Information query