Invention Grant
US08258462B2 Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics 有权
校准和操作离子阱质量分析仪以优化质谱峰特征的方法

Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics
Abstract:
A method for calibrating an ion trap mass spectrometer is disclosed. The method includes establishing an optimal phase and amplitude-m/z relationship by acquiring peak quality data at varying values of amplitude and phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
Information query
Patent Agency Ranking
0/0