Invention Grant
- Patent Title: Photon measurement method and apparatus
- Patent Title (中): 光子测量方法和装置
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Application No.: US11381450Application Date: 2006-05-03
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Publication No.: US08269964B2Publication Date: 2012-09-18
- Inventor: John F. Heanue , Joseph A. Heanue , Brian P. Wilfley , Augustus P. Lowell
- Applicant: John F. Heanue , Joseph A. Heanue , Brian P. Wilfley , Augustus P. Lowell
- Applicant Address: US CO Boulder
- Assignee: Nellcor Puritan Bennett LLC
- Current Assignee: Nellcor Puritan Bennett LLC
- Current Assignee Address: US CO Boulder
- Main IPC: G01J3/30
- IPC: G01J3/30
Abstract:
A system and method for measuring photons utilizing a low-power light source modulated with a code sequence to interrogate a sample of interest. Preferably a portion of the scattered light from the sample is detected by a photo-detector. A correlation of the photo-detector signal and the code sequence produces an estimate of the distribution of flight times for photons traveling from the source to the detector.
Public/Granted literature
- US20070260145A1 PHOTON MEASUREMENT METHOD AND APPARATUS Public/Granted day:2007-11-08
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