Invention Grant
- Patent Title: Nanomaterial observation sample preparation apparatus and preparation method
- Patent Title (中): 纳米材料观察样品制备装置及制备方法
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Application No.: US12365256Application Date: 2009-02-04
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Publication No.: US08276539B2Publication Date: 2012-10-02
- Inventor: Tomonori Kawakami
- Applicant: Tomonori Kawakami
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu-Photonics K.K.
- Current Assignee: Hamamatsu-Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JPP2008-026847 20080206
- Main IPC: B05B5/025
- IPC: B05B5/025 ; B05C11/00 ; C12N15/88

Abstract:
An observation sample is prepared by immobilizing a nanomaterial on a substrate 10 by applying a voltage between a nanomaterial dispersion liquid 13, filled in an interior of an electrostatic spray nozzle 20, and the observation substrate 10 to electrostatically spray and dry the dispersion liquid 13 and electrostatically deposit the nanomaterial. With respect to the observation substrate 10, including a conductive grid portion 11 and a supporting film 12, a reference electrode 81 is disposed below the substrate 10 and a bias voltage of the same polarity as the electrostatic spraying voltage is applied to the grid portion 11 of the substrate 10 to adjust immobilization positions of the nanomaterial on the substrate 10. An observation sample, with which the nanomaterial is immobilized in a satisfactory state on the substrate, can thereby be prepared.
Public/Granted literature
- US20090194418A1 NANOMATERIAL OBSERVATION SAMPLE PREPARATION APPARATUS AND PREPARATION METHOD Public/Granted day:2009-08-06
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