Invention Grant
US08279439B2 Birefringence measuring device and birefringence measuring method 有权
双折射测量装置和双折射测量方法

  • Patent Title: Birefringence measuring device and birefringence measuring method
  • Patent Title (中): 双折射测量装置和双折射测量方法
  • Application No.: US12439441
    Application Date: 2007-06-14
  • Publication No.: US08279439B2
    Publication Date: 2012-10-02
  • Inventor: Kenji Gomi
  • Applicant: Kenji Gomi
  • Applicant Address: JP Tokyo
  • Assignee: Tokyo Denki University
  • Current Assignee: Tokyo Denki University
  • Current Assignee Address: JP Tokyo
  • Agency: Foley & Lardner LLP
  • Priority: JP2006-232380 20060829
  • International Application: PCT/JP2007/062019 WO 20070614
  • International Announcement: WO2008/026363 WO 20080306
  • Main IPC: G01J4/00
  • IPC: G01J4/00
Birefringence measuring device and birefringence measuring method
Abstract:
The present invention is a birefringence measuring device that requires only three types of light intensity information and can measure birefringence characteristics of an object with a relatively inexpensive device configuration. One embodiment comprises a light source for emitting a light flux having a specific polarization state towards the object to be measured, an optical system for extracting each of light fluxes in predetermined three polarization direction; and, from the light flux having passed the object to be measured, a detector for detecting a light amount of each of the light fluxes in the predetermined three polarization directions extracted by the optical system, and a processor for calculating a size and an azimuth of the birefringence of the object to be measured. The processor may calculate the birefringence size and azimuth by assigning each of the light amounts of the light fluxes detected by the detector to a predetermined function expression.
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