Invention Grant
US08305581B2 Methods and apparatus for analyzing samples and collecting sample fractions
有权
用于分析样品和收集样品级分的方法和设备
- Patent Title: Methods and apparatus for analyzing samples and collecting sample fractions
- Patent Title (中): 用于分析样品和收集样品级分的方法和设备
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Application No.: US12960042Application Date: 2010-12-03
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Publication No.: US08305581B2Publication Date: 2012-11-06
- Inventor: James Anderson , Raaidah Saari-Nordhaus , Washington Mendoza , Josef Bystron , Dirk Helgemo , Dennis McCreary
- Applicant: James Anderson , Raaidah Saari-Nordhaus , Washington Mendoza , Josef Bystron , Dirk Helgemo , Dennis McCreary
- Applicant Address: US MD Columbia
- Assignee: Alltech Associates, Inc.
- Current Assignee: Alltech Associates, Inc.
- Current Assignee Address: US MD Columbia
- Agent William D. Bunch
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
Methods and apparatus for analyzing a sample using at least one detector are disclosed.
Public/Granted literature
- US20110310390A1 Methods and Apparatus for Analyzing Samples and Collecting Sample Fractions Public/Granted day:2011-12-22
Information query
