Invention Grant
US08357918B2 Apparatus and method for analyzing a fluorescent sample disposed on a substrate
有权
用于分析设置在基板上的荧光样品的装置和方法
- Patent Title: Apparatus and method for analyzing a fluorescent sample disposed on a substrate
- Patent Title (中): 用于分析设置在基板上的荧光样品的装置和方法
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Application No.: US12525987Application Date: 2008-02-05
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Publication No.: US08357918B2Publication Date: 2013-01-22
- Inventor: Cheong Boon Soh , Swee Chuan Tjin , Ying Hung Yvonne Lam , Lian Soon Ng
- Applicant: Cheong Boon Soh , Swee Chuan Tjin , Ying Hung Yvonne Lam , Lian Soon Ng
- Applicant Address: SG Singapore
- Assignee: Nanyang Technological University
- Current Assignee: Nanyang Technological University
- Current Assignee Address: SG Singapore
- International Application: PCT/SG2008/000042 WO 20080205
- International Announcement: WO2008/097199 WO 20080814
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
An apparatus for analysing a fluorescent sample disposed on a substrate comprises a first processor for producing first and second electrical signals derived from respective first and second light signal components received from a sample and from a substrate. The apparatus produces the first and second electrical signals such that there is a phase difference between phases of the first and second electrical signals. The apparatus comprises a control circuit for producing an attenuation signal for attenuating the second electrical signal.
Public/Granted literature
- US20100332150A1 APPARATUS AND METHOD FOR ANALYZING A FLUORESCENT SAMPLE DISPOSED ON A SUBSTRATE Public/Granted day:2010-12-30
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