Invention Grant
US08357918B2 Apparatus and method for analyzing a fluorescent sample disposed on a substrate 有权
用于分析设置在基板上的荧光样品的装置和方法

Apparatus and method for analyzing a fluorescent sample disposed on a substrate
Abstract:
An apparatus for analysing a fluorescent sample disposed on a substrate comprises a first processor for producing first and second electrical signals derived from respective first and second light signal components received from a sample and from a substrate. The apparatus produces the first and second electrical signals such that there is a phase difference between phases of the first and second electrical signals. The apparatus comprises a control circuit for producing an attenuation signal for attenuating the second electrical signal.
Information query
Patent Agency Ranking
0/0