Invention Grant
- Patent Title: Testbed for testing electronic circuits and components
- Patent Title (中): 用于测试电子电路和组件的测试台
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Application No.: US12039854Application Date: 2008-02-29
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Publication No.: US08390308B2Publication Date: 2013-03-05
- Inventor: Michael Carney , Marek Reksnis , Ted Toth
- Applicant: Michael Carney , Marek Reksnis , Ted Toth
- Applicant Address: CA Waterloo
- Assignee: Research In Motion Limited
- Current Assignee: Research In Motion Limited
- Current Assignee Address: CA Waterloo
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
There is disclosed an electronic testbed, an electronic testbed board, and a method for positioning receptacles for nails in the electronic testbed board. In an embodiment, the electronic testbed board includes a mounting through-hole for mounting a receptacle for a nail. The mounting through-hole is drilled to a suitably precise diameter for mounting the receptacle substantially perpendicular to the testbed board. One or more via-holes are located adjacent the mounting through-hole, and are adapted to allow an electrical connection between any conductive layers provided at the one or more via-holes. The receptacle may be mounted more accurately and the electronic test bed may be built more accurately by separating the functions of the via-holes and the mounting through-hole.
Public/Granted literature
- US20090219045A1 TESTBED FOR TESTING ELECTRONIC CIRCUITS AND COMPONENTS Public/Granted day:2009-09-03
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