Invention Grant
- Patent Title: Article inspection device and inspection method
- Patent Title (中): 物品检验装置及检验方法
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Application No.: US13142712Application Date: 2010-12-28
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Publication No.: US08406375B2Publication Date: 2013-03-26
- Inventor: Yigang Yang , Tiezhu Li , Qinjiar Zhang , Yi Zhang , Yingkang Jin , Qinghao Chen , Yuanjing Li , Yinong Liu
- Applicant: Yigang Yang , Tiezhu Li , Qinjiar Zhang , Yi Zhang , Yingkang Jin , Qinghao Chen , Yuanjing Li , Yinong Liu
- Applicant Address: CN Beijing CN Beijing
- Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Kelly, P.A.
- Priority: CN201010223292 20100630
- International Application: PCT/CN2010/080369 WO 20101228
- International Announcement: WO2012/000298 WO 20120105
- Main IPC: G01N23/201
- IPC: G01N23/201

Abstract:
The present invention discloses an article inspection device, comprising: an x-ray machine, a collimation unit, a transmission detector array and a scattering detector array. The scattering detector array comprising a plurality of same scattering detector modules arranged in a matrix of i-rows and j-columns. A transmission cross section of the article transmitted by the x-rays is divided into a plurality of same sub-regions arranged in a matrix of i-rows and j-columns. The plurality of scattering detector modules arranged in i-rows and j-columns correspond to the plurality of sub-regions arranged in i-rows and j-columns one by one for detecting pair production effect annihilation photons and Compton-effect scattering photons from the respective sub-regions. Obtaining atomic numbers of the respective sub-regions based on a ratio of the pair production effect annihilation photon count to the Compton-effect scattering photon count, so as to form a three-dimensional image of the article. In addition, the present invention further discloses an article inspection method.
Public/Granted literature
- US20120207271A1 ARTICLE INSPECTION DEVICE AND INSPECTION METHOD Public/Granted day:2012-08-16
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