Invention Grant
- Patent Title: Planar lightwave fourier-transform spectrometer measurement including phase shifting for error correction
- Patent Title (中): 平面光波傅里叶变换光谱仪测量包括用于纠错的相移
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Application No.: US13192577Application Date: 2011-07-28
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Publication No.: US08406580B2Publication Date: 2013-03-26
- Inventor: Kazumasa Takada , Katsunari Okamoto
- Applicant: Kazumasa Takada , Katsunari Okamoto
- Applicant Address: JP Ibaraki JP Guma
- Assignee: AiDi Corporation,GUNMA University
- Current Assignee: AiDi Corporation,GUNMA University
- Current Assignee Address: JP Ibaraki JP Guma
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Jeffrey Klembczyk, Esq.; Kevin P. Radigan, Esq.
- Main IPC: G02B6/12
- IPC: G02B6/12 ; G01J3/45

Abstract:
A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.
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