Invention Grant
US08410432B2 Method and apparatus for enhanced ion mobility based sample analysis using various analyzer configurations
有权
使用各种分析仪配置增强离子迁移率样品分析的方法和设备
- Patent Title: Method and apparatus for enhanced ion mobility based sample analysis using various analyzer configurations
- Patent Title (中): 使用各种分析仪配置增强离子迁移率样品分析的方法和设备
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Application No.: US13205108Application Date: 2011-08-08
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Publication No.: US08410432B2Publication Date: 2013-04-02
- Inventor: Raanan A. Miller , Evgeny Krylova , Erkinjon G. Nazarov , Gary A. Eiceman , John A. Wright
- Applicant: Raanan A. Miller , Evgeny Krylova , Erkinjon G. Nazarov , Gary A. Eiceman , John A. Wright
- Applicant Address: SG
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG
- Main IPC: H01J49/00
- IPC: H01J49/00 ; B01D59/44

Abstract:
A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.
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