Invention Grant
- Patent Title: Methods and systems for determining the average atomic number and mass of materials
-
Application No.: US13275909Application Date: 2011-10-18
-
Publication No.: US08411822B2Publication Date: 2013-04-02
- Inventor: Robert J. Ledoux , William Bertozzi
- Applicant: Robert J. Ledoux , William Bertozzi
- Applicant Address: US MA Billerica
- Assignee: Passport Systems, Inc.
- Current Assignee: Passport Systems, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Foley Hoag LLP
- Main IPC: G01N23/201
- IPC: G01N23/201

Abstract:
Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
Public/Granted literature
- US20120183125A1 METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS Public/Granted day:2012-07-19
Information query