Invention Grant
- Patent Title: Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator
- Patent Title (中): 量子效率测量方法,量子效率测量装置和积分器
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Application No.: US13033612Application Date: 2011-02-24
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Publication No.: US08415639B2Publication Date: 2013-04-09
- Inventor: Yoshihiro Osawa , Kazuaki Ohkubo
- Applicant: Yoshihiro Osawa , Kazuaki Ohkubo
- Applicant Address: JP Hirakata-shi
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Hirakata-shi
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2010-061804 20100318
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
Public/Granted literature
- US20110226961A1 QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREMENT APPARATUS, AND INTEGRATOR Public/Granted day:2011-09-22
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