Invention Grant
- Patent Title: Optical proximity correction method
- Patent Title (中): 光学邻近校正方法
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Application No.: US13186475Application Date: 2011-07-20
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Publication No.: US08423923B2Publication Date: 2013-04-16
- Inventor: Chia-Wei Huang , Ming-Jui Chen , Ting-Cheng Tseng , Hui-Fang Kuo
- Applicant: Chia-Wei Huang , Ming-Jui Chen , Ting-Cheng Tseng , Hui-Fang Kuo
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G03F1/00 ; G03F7/00

Abstract:
An optical proximity correction method is provided. A target pattern is provided, and then the target pattern is decomposed to a first pattern and a second pattern. The first pattern and the second pattern are alternately arranged in a dense region. Then, a compensation pattern is provided and it is determined whether the compensation pattern is added into the first pattern to become a first revised pattern, or into the second pattern to become a second revised pattern. Finally, the first revised pattern is output onto a first mask and the second revised pattern is output onto a second mask.
Public/Granted literature
- US20130024824A1 Optical Proximity Correction Method Public/Granted day:2013-01-24
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