Invention Grant
- Patent Title: Scanning microscope device
- Patent Title (中): 扫描显微镜装置
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Application No.: US12784643Application Date: 2010-05-21
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Publication No.: US08445865B2Publication Date: 2013-05-21
- Inventor: Hiroshi Sasaki , Tatsuo Nakata
- Applicant: Hiroshi Sasaki , Tatsuo Nakata
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Hotlz, Goodman & Chick, P.C.
- Priority: JP2009-123912 20090522
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
A scanning microscope device includes a light source that emits laser light; an X-Y galvanometer mirror that scans the laser light on a sample; an objective lens that irradiates the sample with the scanned laser light and collects fluorescence generated at an irradiated position; a non-descan-detection excitation DM that is disposed between the X-Y galvanometer mirror and the objective lens and separates the laser light and the fluorescence from each other; a fiber that receives the separated fluorescence through an entrance end thereof and emits the fluorescence from an exit end thereof that is formed in a substantially linear shape; a diffraction grating that disperses the fluorescence emitted from the exit end of the fiber in a direction orthogonal to a longitudinal direction of the exit end; and a multi-anode PMT having plural cells arrayed in the dispersing direction of the dispersed fluorescence.
Public/Granted literature
- US20100294949A1 SCANNING MICROSCOPE DEVICE Public/Granted day:2010-11-25
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