Invention Grant
US08476585B2 Microtome utilizing a movable knife in a retardation field scanning electron microscope and a retardation field scanning electron microscope including the same
有权
在延迟场扫描电子显微镜中使用可动刀的切片机和包括该切片机的延迟场扫描电子显微镜
- Patent Title: Microtome utilizing a movable knife in a retardation field scanning electron microscope and a retardation field scanning electron microscope including the same
- Patent Title (中): 在延迟场扫描电子显微镜中使用可动刀的切片机和包括该切片机的延迟场扫描电子显微镜
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Application No.: US13408054Application Date: 2012-02-29
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Publication No.: US08476585B2Publication Date: 2013-07-02
- Inventor: Simon Andrew Galloway
- Applicant: Simon Andrew Galloway
- Applicant Address: US PA Warrendale
- Assignee: Gatan, Inc.
- Current Assignee: Gatan, Inc.
- Current Assignee Address: US PA Warrendale
- Agency: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.
- Main IPC: H01J37/26
- IPC: H01J37/26 ; H01J37/28 ; B01D59/44 ; H01J37/20 ; H01J37/18 ; G01N1/06 ; B23K15/10

Abstract:
A microtome for in situ residence within a chamber of a scanning electron microscope (SEM) and a SEM including the microtome is disclosed. The microtome includes a specimen holder for holding a specimen thereon at high voltage to produce a retardation field thereat and a movable knife. The SEM includes a backscatter electron detector disposed adjacent to specimen holder. The knife arranged is to be carried into engagement with the specimen on the specimen holder to slice a portion of the specimen away to expose a new face of the specimen without interfering with the high voltage on the specimen, and is mounted so that after having engaged the specimen to expose a new face of the specimen it is withdrawn to a retracted position whereupon it does not interfere with the retardation field.
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