Invention Grant
- Patent Title: Method and system for inspecting beveled objects
- Patent Title (中): 用于检查斜面物体的方法和系统
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Application No.: US13197817Application Date: 2011-08-04
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Publication No.: US08477309B2Publication Date: 2013-07-02
- Inventor: Zehava Ben-Ezer
- Applicant: Zehava Ben-Ezer
- Applicant Address: IL Migdal Haemek
- Assignee: Camtek Ltd.
- Current Assignee: Camtek Ltd.
- Current Assignee Address: IL Migdal Haemek
- Agent Oren Reches
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/00

Abstract:
An inspection system and a method. The method may include: illuminating the object with impinging light of a first polarization; performing a polarization based filtering of (a) multiple-reflected light signals, each multiple-reflected light signal being reflected from at least two different bevel side surfaces of the object, and (b) additional light signals, each additional light signal being reflected from a single element of the object, such as to suppress the multiple-reflected light signals, and to provide polarization based filtered light signals; and detecting the polarization based filtered light signals.
Public/Granted literature
- US20120038921A1 METHOD AND SYSTEM FOR INSPECTING BEVELED OBJECTS Public/Granted day:2012-02-16
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