Invention Grant
US08477309B2 Method and system for inspecting beveled objects 有权
用于检查斜面物体的方法和系统

  • Patent Title: Method and system for inspecting beveled objects
  • Patent Title (中): 用于检查斜面物体的方法和系统
  • Application No.: US13197817
    Application Date: 2011-08-04
  • Publication No.: US08477309B2
    Publication Date: 2013-07-02
  • Inventor: Zehava Ben-Ezer
  • Applicant: Zehava Ben-Ezer
  • Applicant Address: IL Migdal Haemek
  • Assignee: Camtek Ltd.
  • Current Assignee: Camtek Ltd.
  • Current Assignee Address: IL Migdal Haemek
  • Agent Oren Reches
  • Main IPC: G01J4/00
  • IPC: G01J4/00 G01N21/00
Method and system for inspecting beveled objects
Abstract:
An inspection system and a method. The method may include: illuminating the object with impinging light of a first polarization; performing a polarization based filtering of (a) multiple-reflected light signals, each multiple-reflected light signal being reflected from at least two different bevel side surfaces of the object, and (b) additional light signals, each additional light signal being reflected from a single element of the object, such as to suppress the multiple-reflected light signals, and to provide polarization based filtered light signals; and detecting the polarization based filtered light signals.
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