Invention Grant
- Patent Title: Polarization based interferometric detector
- Patent Title (中): 基于偏振的干涉检测器
-
Application No.: US11735900Application Date: 2007-04-16
-
Publication No.: US08488120B2Publication Date: 2013-07-16
- Inventor: John Hall , Viatcheslav Petropavloskikh , Oyvind Nilsen
- Applicant: John Hall , Viatcheslav Petropavloskikh , Oyvind Nilsen
- Applicant Address: US CO Boulder
- Assignee: Bioptix Diagnostics, Inc.
- Current Assignee: Bioptix Diagnostics, Inc.
- Current Assignee Address: US CO Boulder
- Agency: Wilson Sonsini Goodrich & Rosati
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.
Public/Granted literature
- US20080002202A1 Polarization Based Interferometric Detector Public/Granted day:2008-01-03
Information query