Invention Grant
- Patent Title: Low-hysteresis high-speed differential sampler
- Patent Title (中): 低滞后高速差分采样器
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Application No.: US13300089Application Date: 2011-11-18
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Publication No.: US08497723B2Publication Date: 2013-07-30
- Inventor: Jingcheng Zhuang
- Applicant: Jingcheng Zhuang
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Hamilton & Terrile, LLP
- Agent Michael Rocco Cannatti
- Main IPC: H03K3/00
- IPC: H03K3/00
Abstract:
A low-hysteresis high-speed latch circuit is disclosed which isolates a sample stage and hold stage from one another during a latch clock phase and simultaneously shorts the output nodes together during the latch clock phase to reduce hysteresis of the latch.
Public/Granted literature
- US20130127507A1 LOW-HYSTERESIS HIGH-SPEED DIFFERENTIAL SAMPLER Public/Granted day:2013-05-23
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