Invention Grant
US08502973B2 Optical emission analyzer 有权
光发射分析仪

  • Patent Title: Optical emission analyzer
  • Patent Title (中): 光发射分析仪
  • Application No.: US12676096
    Application Date: 2007-09-04
  • Publication No.: US08502973B2
    Publication Date: 2013-08-06
  • Inventor: Haruki Osa
  • Applicant: Haruki Osa
  • Applicant Address: JP Kyoto
  • Assignee: Shimadzu Corporation
  • Current Assignee: Shimadzu Corporation
  • Current Assignee Address: JP Kyoto
  • Agency: Sughrue Mion, PLLC
  • International Application: PCT/JP2007/000953 WO 20070904
  • International Announcement: WO2009/031180 WO 20090312
  • Main IPC: G01J3/30
  • IPC: G01J3/30
Optical emission analyzer
Abstract:
An optical emission analyzer is provided with a circuit-closing switch (56) for changing the state of an arc-generating circuit 5 between the closed state and the open state and a reverse-blocking diode (55) for preventing a spark current from flowing into the circuit-closing switch (56). The circuit-closing switch (56) is turned on before the beginning of a spark discharge between a discharge electrode (31) and a sample (32) to initiate excitation of a coil (53). Consequently, the excitation current of the coil (53) can be increased to a target value within the duration of the spark discharge without using a low-inductance coil or increasing the switching frequency of a switching element (52).
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